发明名称 APPARATUS AND METHOD FOR MEASURING BIREFRINGENCE
摘要 An apparatus and a method for measuring birefringence are provided to precisely measure phase and path differences of optical products and to measure birefringence only by image processing without having a mechanical driver, by using signal intensity and intensity ratio generated while two different types of short-wave lasers with different frequencies pass through a transparent plastic substrate. An apparatus for measuring birefringence comprises an optical system(10), an amplifier, a terminal(30), an A/D converter(40), a stepping motor(60), and a reference signal processor(50). The optical system is where two different types of lasers are projected by a light source(11) and a signal obtained by phase modulation is detected. The amplifier extracts two types of signal intensities detected by the optical system. The terminal is provided with a stored-program that collects the signal generated by the amplifier and measures birefringence by using the signal intensities and signal intensity ratio. The A/D converter converts the analog signal from the amplifier into a digital signal. The stepping motor rotates a sample substrate(S) included in the optical system. The reference signal processor presents a modulation amplitude of a PEM(Photo-Elastic Modulator,13) of the optical system to the signal collected by the amplifier.
申请公布号 KR20080006187(A) 申请公布日期 2008.01.16
申请号 KR20060065006 申请日期 2006.07.11
申请人 KOREA INSTITUTE OF INDUSTRIAL TECHNOLOGY 发明人 KIM, JONG SUN;HWANG, CHUL JIN;KO, YOUNG BAE;HEO, YOUNG MOO
分类号 G01N21/23;G01J4/00 主分类号 G01N21/23
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