发明名称 Charged particle beam device probe operation
摘要 An apparatus including a positioner control device, a measuring device and a control routine. The positioner control device is communicatively coupled to a chamber of a charged particle beam device (CPBD) and is configured to individually manipulate each of a plurality of probes within the CPBD chamber to establish contact between ones of the plurality of probes and corresponding ones of a plurality of contact points of a sample positioned in the CPBD chamber. The measuring device is communicatively coupled to the CPBD and the positioner control device and is configured to perform one of a measurement and a detection of a characteristic associated with one of the plurality of contact points. The control routine is configured to at least partially automate control of at least one of the CPBD, the positioner control device and the measuring device.
申请公布号 US7319336(B2) 申请公布日期 2008.01.15
申请号 US20050064127 申请日期 2005.02.23
申请人 ZYVEX INSTRUMENTS, LLC 发明人 BAUR CHRISTOF;FOLARON ROBERT J.;HARTMAN ADAM;FOSTER PHILIP C.;NELSON JAY C.;STALLCUP, II RICHARD E.
分类号 G01R31/305;H01J37/20;G01N1/28;G01N1/32;G01N23/00;G01R31/02;G01R31/26;H01J37/28;H01J37/305 主分类号 G01R31/305
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