发明名称 SAMPLE IMAGING APPARATUS AND SAMPLE ILLUMINATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a sample imaging apparatus capable of acquiring the image due to different kinds of illuminations, while suppressing the effects on the throughput and capable of being constituted easily, and to provide a sample illumination method. SOLUTION: The sample-imaging apparatus 1 is equipped with an imaging element 15, constituted so that the pixel signal which forms an odd number field and a pixel signal which forms an even number field are extracted alternately from a light-detecting part and an illumination light changeover device 25 for changing-over illumination light for illuminating the surface of a sample, in a synchronous relation to the change-over of the fields, wherein the pixel signals are extracted of the light-detecting part. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008002932(A) 申请公布日期 2008.01.10
申请号 JP20060172381 申请日期 2006.06.22
申请人 TOKYO SEIMITSU CO LTD 发明人 MIYAZAKI YOKO
分类号 G01N21/956 主分类号 G01N21/956
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