| 摘要 |
A timing library and a method for building a cell library including the same are provided to build the timing library by finding a proper maximal transition time value through one simulation and build the cell library by using the timing library. A delay time of a simulation circuit is measured by performing the simulation based on one of conditions according to a process, voltage, and temperature change of the simulation circuit. The maximum transition time for one condition is found from the measured delay time. The simulation circuit includes a first and second flip-flop(30,40), and 20 NAND cells(1-20) connected between the first and second flip-flops in a series. The maximum transition time is found by multiplying 0.175 by the measured delay time.
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