发明名称 Positive type resist composition and resist pattern formation method using same
摘要 There is provided a positive type resin composition comprising (A) a resin component comprising within the principal chain a structural unit derived from a (meth)acrylate ester and incorporating an acid dissociable, dissolution inhibiting group containing a polycyclic group on an ester side chain section, for which the solubility in alkali increases under the action of acid, (B) an acid generator component which generates acid on exposure, and (C) an organic solvent, wherein the component (A) comprises both a structural unit derived from a methacrylate ester and a structural unit derived from an acrylate ester. According to such a resist composition, a resist pattern can be formed which displays little surface roughness and line edge roughness on etching, and also offers excellent resolution and a wide depth of focus range.
申请公布号 US7316889(B2) 申请公布日期 2008.01.08
申请号 US20060347423 申请日期 2006.02.02
申请人 TOKYO OHKA KOGYO CO., LTD. 发明人 IWAI TAKESHI;KUBOTA NAOTAKA;FUJIMURA SATOSHI;MIYAIRI MIWA;HADA HIDEO
分类号 G03F7/004;G03F7/039;H01L21/027 主分类号 G03F7/004
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