发明名称 Control system for pattern generator in maskless lithography
摘要 A lithographic apparatus comprises an illumination system, an array of individually controllable elements, a projection system, and a control system. The illumination system is configured to condition a radiation beam. The array of individually controllable elements is capable of modulating the cross-section of the radiation beam. The projection system is configured to project the modulated radiation beam onto a target portion of a substrate. The control system is arranged to send control signals, which control the array of individually controllable elements, such that a desired pattern is projected onto the substrate. The control system calculates the control signals using a bandwidth limited base function or a combination of more than one bandwidth limited base functions.
申请公布号 US2008002174(A1) 申请公布日期 2008.01.03
申请号 US20060478298 申请日期 2006.06.30
申请人 ASML NETHERLANDS B.V. 发明人 TINNEMANS PATRICIUS ALOYSIUS JACOBUS
分类号 G03B27/54 主分类号 G03B27/54
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