发明名称 LITHOGRAPHIC APPARATUS COMPRISING A CLEANING ARRANGEMENT, CLEANING ARRANGEMENT AND METHOD FOR CLEANING A SURFACE TO BE CLEANED
摘要 A cleaning arrangement is provided for use in an EUV lithographic apparatus, for example an EUV lithographic apparatus with a Sn source. The cleaning arrangement includes a gas source for a hydrogen containing gas and a hydrogen radical source. The hydrogen radical source is a source of (UV) radiation which induces photo dissociation of the hydrogen. Radicals may reduce Sn oxides (if present) and my form volatile hydrides of Sn deposition and/or carbon deposition. In this way the cleaning arrangement can be used to clean optical elements from Sn and/or C deposition. The EUV source may be used as hydrogen radical source. An optical filter is used to remove undesired EUV radiation and transmit desired UV radiation.
申请公布号 WO2008002134(A2) 申请公布日期 2008.01.03
申请号 WO2007NL50308 申请日期 2007.06.27
申请人 ASML NETHERLANDS B.V.;VAN HERPEN, MAARTEN, MARINUS, JOHANNES, WILHELMUS;KLUNDER, DERK,JAN, WILFRED 发明人 VAN HERPEN, MAARTEN, MARINUS, JOHANNES, WILHELMUS;KLUNDER, DERK,JAN, WILFRED
分类号 G03F7/20;B08B7/00 主分类号 G03F7/20
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