SEMICONDUCTOR DEVICE AND SEMICONDUCTOR MEASURING DEVICE

摘要

A semiconductor device and a semiconductor measuring device are provided to simplify the structure and to reduce the cost by measuring the electrical characteristic of the semiconductor device and voltage and current of a terminal without using a kelvin contact probe and a voltage measuring unit. In a semiconductor device(210) having an external terminal(A) for connecting a load and a current drive transistor(M1) for supplying current to the load, a comparator(211) compares the voltage of the external terminal and reference voltage(Vref). An external terminal(B) is connected to the output side of the comparator. A boosting circuit boosts power voltage and supplies the boosted power voltage to the load. The boosting rate of the boosting circuit is changed on the basis of the output of the comparator.