发明名称 METHOD FOR PRODUCING A SEMICONDUCTOR WAFER WITH A PROFILED EDGE
摘要 <p>The invention relates to a method for producing a semiconductor wafer with a profiled edge, comprising the following steps: the separation of the semiconductor wafer from a crystal; an edge profile producing step, in which the edge is mechanically machined and acquires a profile that is true to scale with respect to a target profile; a mechanical machining step, in which a thickness of the semiconductor wafer is reduced; and an edge profile machining step, in which the edge is mechanically machined and acquires the target profile.</p>
申请公布号 SG137765(A1) 申请公布日期 2007.12.28
申请号 SG20070033111 申请日期 2007.05.08
申请人 SILTRONIC AG 发明人 MATTES JOACHIM;HUBER ANTON;MOSER JOERG
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