| 摘要 |
<p>A semiconductor test handler and a tray transferring method are provided to hold simultaneously two trays and to reduce a tray supplying time by using a tray gripper. A semiconductor test handler includes a base(152), a plurality of holders(154,158) extended and contracted to both sides of the base in order to hold selectively a tray, and a gripper having a driving unit for driving the holders. The holders are composed of a first holder and a second holder. The driving unit includes an actuator for driving the first holder and the second holder. The first holder is positioned at the outside of the base in comparison with the second holder. An end part extended from the first holder is positioned at a lower part of the base in comparison with an end part extended from the second holder. The first and second holders are used for holding by stacking trays. Further, a sensor unit is installed in order to sense existence the trays along a movement of the base at one side of the base.</p> |
