| 摘要 |
PROBLEM TO BE SOLVED: To easily detect a defective terminal without lowering manufacturing efficiency in terminals wherein fault is apt to occur or in all terminals necessary to be analyzed. SOLUTION: Different identification marks 340 are provided to connection terminals 302 of a semiconductor device. Thus, a defective terminal can be easily detected without lowering manufacturing efficiency in terminals wherein fault is apt to occur or in all terminals necessary to be analyzed. COPYRIGHT: (C)2008,JPO&INPIT
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