发明名称 CHARACTERISTIC MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a characteristic measuring apparatus capable of stably detecting whether objects to be measured are in contact or not without being affected by contact resistance values. SOLUTION: By providing a resistor R<SB>A</SB>for each of measuring terminals T<SB>2</SB>and T<SB>4</SB>, a DC resistance value (an overall resistance value) when view from an impedance measuring device 18 is r+(R+R<SB>A</SB>)/2 when r=r<SB>1</SB>≈r<SB>2</SB>≈r<SB>3</SB>≈r<SB>4</SB>and R=R<SB>1</SB>≈R<SB>2</SB>. At this time, by making a resistance value of each resistor R<SB>A</SB>sufficient large to a contact resistance value (r), R<SB>A</SB>makes up a large percentage of the overall resistance value. The overall resistance value therefore significantly depends on a resistance value of the resistor R<SB>A</SB>. The overall resistance value (a value of combined resistance) is thereby hardly affected by variations in the contact resistance value (r). COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007333438(A) 申请公布日期 2007.12.27
申请号 JP20060162868 申请日期 2006.06.12
申请人 MURATA MFG CO LTD 发明人 TANAKA HIDEJI;HAYATO YUKINOBU
分类号 G01R27/02;G01R31/06;H01C13/00;H01F37/00 主分类号 G01R27/02
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