| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a component analyzer capable of easily stopping a specimen at a position suitable for the analysis of a component and capable of analyzing the components with high accuracy, without destroying the specimen. <P>SOLUTION: The component analyzer 1 analyzes the components of the specimen 10, by irradiating the specimen 10 on a mount 23 with infrared rays and investigating the measuring spectrum converted from the diffused reflected light of infrared ray, and is equipped with a support stand 22, on which the placing stand 23 slides and the contact body 20 provided to the support stand 22 to stop the slide of the placing stand 23. <P>COPYRIGHT: (C)2008,JPO&INPIT</p> |
