发明名称 APPARATUS OF TESTING DISPLAY APPARATUS AND METHOD OF TESTING THE SAME
摘要 An inspecting apparatus and a method for inspecting a display device using the same are provided to change only alignment positions of a display panel and an inspecting unit when an inspecting method is changed, thereby shortening the inspecting time. An inspecting apparatus comprises a work stage(100) for loading a display panel(500), and an inspecting unit(200) for inspecting driving errors of the display panel by supplying first and second test signals to the display panel. The inspecting unit includes a body(210), a plurality of probes(220) joined to a lower surface of the body, a contact bar(230) disposed below the probes, and a connection portion(240) joined to the contact bar and the body. The probes output the first test signal to supply the first signal to the display panel. The contact bar outputs the second test signal to supply the second test signal to the display panel. The connection portion fixes the contact bar to the body.
申请公布号 KR20070121183(A) 申请公布日期 2007.12.27
申请号 KR20060055914 申请日期 2006.06.21
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, JIN HWAN;CHO, JONG BOK;LIM, SUNG MUK;WOO, SUNG BONG;SHIN, SANG WOON
分类号 G02F1/13 主分类号 G02F1/13
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