| 发明名称 |
A TEST STRUCTURE AND PROBE FOR DIFFERENTIAL SIGNALS |
| 摘要 |
<p>A test structure including a differential gain cell and a differential signal probe include compensation for the Miller effect reducing the frequency dependent variability of the input impedance of the test structure.</p> |
| 申请公布号 |
WO2007145728(A2) |
申请公布日期 |
2007.12.21 |
| 申请号 |
WO2007US10801 |
申请日期 |
2007.05.03 |
| 申请人 |
CASCADE MICROTECH, INC.;CAMPBELL, RICHARD |
发明人 |
CAMPBELL, RICHARD |
| 分类号 |
G01R31/00 |
主分类号 |
G01R31/00 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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