发明名称 Method for enabling comprehensive profiling of garbage-collected memory systems
摘要 A method and apparatus for profiling a heap. According to the method, a flexible and comprehensive general-purpose profiling interface that uniformly accommodates a wide variety of memory allocation and garbage collection methods is used. The profiling interface, among other things, employs a set of virtual machine profiling interface events that support all known types of garbage collection methods.
申请公布号 US7310718(B1) 申请公布日期 2007.12.18
申请号 US19990856779 申请日期 1999.11.24
申请人 SUN MICROSYSTEMS, INC. 发明人 LIANG SHENG;GRARUP STEFFEN
分类号 G06F12/00;G06F11/34;G06F12/02 主分类号 G06F12/00
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