发明名称 |
Profilometry apparatus and method of operation |
摘要 |
A profilometry apparatus is provided. The profilometry apparatus includes a fringe projection device configured to project a fringe pattern on an object and an optical unit configured to capture an image of a distorted fringe pattern modulated by the object. The profilometry apparatus also includes a signal processing unit configured to process the captured image from the optical unit to filter noise from the image and to obtain real-time estimation of parameters associated with manufacture or repair of the object.
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申请公布号 |
US2007279639(A1) |
申请公布日期 |
2007.12.06 |
申请号 |
US20060445515 |
申请日期 |
2006.06.02 |
申请人 |
GENERAL ELECTRIC COMPANY |
发明人 |
HU QINGYING;AZER MAGDI NAIM;HARDING KEVIN GEORGE;DEATON JOHN BRODDUS;TEWARI SUDHIR KUMAR |
分类号 |
G01B11/02 |
主分类号 |
G01B11/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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