发明名称 Illumination system for use during manufacturing of e.g. integrated circuit, has optical units arranged between collector and illumination field, and optical axis deflected onto illumination-main level around preset degrees
摘要 <p>The system (1) has reflecting optical units (10-15) arranged between a collector and an illumination field (2). An optical axis (7) strikes the optical units at an incident angle, which is either greater than 70 degrees or smaller than 20 degrees. A deflection angle extends between source-axial sections (19) of the axis, which runs between the collector and one of the units. A field-axial section (17) of the optical axis continues between the unit (15) and the field. The optical axis is projectedly deflected onto an illumination-main level (18) between the sections around 30 degrees. An independent claim is also included for a method for microlithographically manufacturing a micro-structured component.</p>
申请公布号 DE102006026032(A1) 申请公布日期 2007.12.06
申请号 DE20061026032 申请日期 2006.06.01
申请人 CARL ZEISS SMT AG 发明人 ENDRES, MARTIN;OSSMANN, JENS
分类号 G03F7/20;G02B17/00 主分类号 G03F7/20
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