发明名称 |
Illumination system for use during manufacturing of e.g. integrated circuit, has optical units arranged between collector and illumination field, and optical axis deflected onto illumination-main level around preset degrees |
摘要 |
<p>The system (1) has reflecting optical units (10-15) arranged between a collector and an illumination field (2). An optical axis (7) strikes the optical units at an incident angle, which is either greater than 70 degrees or smaller than 20 degrees. A deflection angle extends between source-axial sections (19) of the axis, which runs between the collector and one of the units. A field-axial section (17) of the optical axis continues between the unit (15) and the field. The optical axis is projectedly deflected onto an illumination-main level (18) between the sections around 30 degrees. An independent claim is also included for a method for microlithographically manufacturing a micro-structured component.</p> |
申请公布号 |
DE102006026032(A1) |
申请公布日期 |
2007.12.06 |
申请号 |
DE20061026032 |
申请日期 |
2006.06.01 |
申请人 |
CARL ZEISS SMT AG |
发明人 |
ENDRES, MARTIN;OSSMANN, JENS |
分类号 |
G03F7/20;G02B17/00 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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