发明名称 SEMICONDUCTOR DEVICE, AND ITS MANUFACTURING PROCESS
摘要 <p><P>PROBLEM TO BE SOLVED: To prevent exfoliation between insulating films in a semiconductor device where two layers of insulating film composed of a low dielectric constant material such as BCB and two layers of interconnection are laminated alternately on a silicon substrate. <P>SOLUTION: On the upper surface of a passivation film 3 of silicon oxide, or the like, which is provided on the upper surface of a silicon substrate 1 excepting the peripheral part thereof, first and second insulating films 5 and 9 and first and second interconnections 8 and 12 formed of the low dielectric constant material such as BCB and the like are laminated alternately. Upper surface of the second insulating film 9 including the second interconnection 12 and the side face of the first and second insulating films 5 and 9 are covered with a sealing film 14 of epoxy-based resin, or the like. With such an arrangement, exfoliation can be prevented between the first and second insulating films 5 and 9. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2007317692(A) 申请公布日期 2007.12.06
申请号 JP20060142443 申请日期 2006.05.23
申请人 CASIO COMPUT CO LTD 发明人 MIZUSAWA AIKO;OKADA OSAMU;WAKABAYASHI TAKESHI
分类号 H01L21/3205;H01L21/768;H01L23/12;H01L23/29;H01L23/31;H01L23/52;H01L23/522 主分类号 H01L21/3205
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