发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 <p>An object is to provide a technique to manufacture an insulating film having excellent film characteristics. In particular, an object is to provide a technique to manufacture a dense insulating film with a high withstand voltage. Moreover, an object is to provide a technique to manufacture an insulating film with few electron traps. An insulating film including oxygen is subjected to plasma treatment using a high frequency under the conditions where the electron density is 1 1011 cm-3 or more and the electron temperature is 1.5 eV or less in an atmosphere including oxygen.</p>
申请公布号 WO2007138937(A1) 申请公布日期 2007.12.06
申请号 WO2007JP60477 申请日期 2007.05.16
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD.;KAKEHATA, TETSUYA;TANAKA, TETSUHIRO;ASAMI, YOSHINOBU 发明人 KAKEHATA, TETSUYA;TANAKA, TETSUHIRO;ASAMI, YOSHINOBU
分类号 H01L21/8247;H01L21/316;H01L21/336;H01L27/115;H01L29/78;H01L29/786;H01L29/788;H01L29/792 主分类号 H01L21/8247
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