发明名称 On die thermal sensor of semiconductor memory device
摘要 An on die thermal sensor (ODTS) of a semiconductor memory device includes a high voltage generating unit for generating a high voltage having a voltage level higher than that of a power supply voltage of the semiconductor memory device; and a thermal information output unit for sensing and outputting a temperature as a thermal information code, wherein the thermal information output unit uses the high voltage as its driving voltage.
申请公布号 US2007280330(A1) 申请公布日期 2007.12.06
申请号 US20060646328 申请日期 2006.12.28
申请人 HYNIX SEMICONDUCTOR INC 发明人 JEONG CHUN-SEOK;KIM YONG-KI
分类号 G01K1/14 主分类号 G01K1/14
代理机构 代理人
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