发明名称 POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN
摘要 <p>A positive resist composition comprising a resin ingredient (A) which comes to have enhanced alkali solubility by the action of an acid and an acid generator ingredient (B) which generates an acid upon exposure to light, wherein the resin ingredient (A) has a structural unit (a0) represented by the following general formula (a0) [R is hydrogen, halogeno, lower alkyl, or lower haloalkyl; Y&lt;SUP&gt;1&lt;/SUP&gt; is an aliphatic cyclic group; Z is a group containing tert-alkyl; a is an integer of 1-3 and b is an integer of 0-2, provided that a+b is 1-3; and c, d, and e each independently is 0-3] and a structural unit (a1) derived from an acrylic ester of the tert-alkyl ester type which contains an acid-dissociable dissolution-inhibitive group having a polycyclic group. (a0)</p>
申请公布号 WO2007138797(A1) 申请公布日期 2007.12.06
申请号 WO2007JP58444 申请日期 2007.04.18
申请人 TOKYO OHKA KOGYO CO., LTD.;TAKESHITA, MASARU;WATANABE, RYOJI 发明人 TAKESHITA, MASARU;WATANABE, RYOJI
分类号 G03F7/039;H01L21/027 主分类号 G03F7/039
代理机构 代理人
主权项
地址