| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an IC card test device by which a developer of an IC card program can easily prepare a test pattern. <P>SOLUTION: The IC card test device 1 stores a test script 15 described in script language. When testing the IC card program, the IC card test device 1 successively interprets statements included in the designated test script, and makes an emulator 2 execute the interpreted processing for testing the IC card program stored in the emulator 2. For example, the IC card test device 1 generates a command APDU described with hexadecimal characters according to the program interface specifications of the IC card from the test script described in script language, and tests the IC card program by using the generated command APDU. <P>COPYRIGHT: (C)2008,JPO&INPIT |
