发明名称 METHOD FOR FORMING METAL COMPOUND LAYER, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND APPARATUS FOR FORMING METAL COMPOUND LAYER
摘要 <p>Disclosed is a method for forming a metal compound layer, which comprises a step for preparing, in a chamber, a substrate wherein a semiconductor material composed of silicon, germanium or silicon-germanium is exposed in the surface; and a metal compound layer forming step wherein a raw material gas containing a metal which is capable of forming a metal compound with the semiconductor material is supplied into the chamber and the substrate is heated to a temperature at which the raw material gas is thermally decomposed, thereby reacting the metal with the semiconductor material and forming a metal compound layer under such conditions that the metal does not deposit on the substrate. Also disclosed is a method for manufacturing a semiconductor device, which utilizes this method for forming a metal compound layer.</p>
申请公布号 WO2007139041(A1) 申请公布日期 2007.12.06
申请号 WO2007JP60745 申请日期 2007.05.21
申请人 NEC CORPORATION;NAKAGAWA, TAKASHI;TATSUMI, TORU;OSHIDA, MAKIKO;IKARASHI, NOBUYUKI;TAKAHASHI, KENSUKE;MANABE, KENZO 发明人 NAKAGAWA, TAKASHI;TATSUMI, TORU;OSHIDA, MAKIKO;IKARASHI, NOBUYUKI;TAKAHASHI, KENSUKE;MANABE, KENZO
分类号 H01L21/285;C23C16/06;C23C16/42;H01L21/28;H01L21/336;H01L29/78 主分类号 H01L21/285
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