发明名称 Self-assembled mono-layer liner for cu/porous low-k interconnections
摘要 An interconnect structure of an integrated circuit includes a low-k dielectric layer over a semiconductor substrate, a conductor in the low-k dielectric layer, and a dielectric transition layer between the low-k dielectric layer and the conductor, wherein the dielectric transition layer has a thickness of less than about 50 Å.
申请公布号 US2007278682(A1) 申请公布日期 2007.12.06
申请号 US20060509498 申请日期 2006.08.24
申请人 KO CHUNG-CHI;CHOU CHIA-CHENG;LIN KENG-CHU;BAO TIEN-I;YU CHEN-HUA 发明人 KO CHUNG-CHI;CHOU CHIA-CHENG;LIN KENG-CHU;BAO TIEN-I;YU CHEN-HUA
分类号 H01L23/52;H01L23/48;H01L29/40 主分类号 H01L23/52
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