发明名称 METHOD OF CLEANING POST-CMP WAFER
摘要 A post-CMP wafer is loaded into a buffer unit of a cleaning apparatus and is kept moist by adding a chemical. The post-CMP wafer is then loaded into a cleaning unit of the cleaning apparatus for performing the following cleaning process. The chemical added in the buffer unit is used to reduce the adhesion of benzotriazole (BTA) for improving the cleanliness of the post-CMP wafer.
申请公布号 SG136823(A1) 申请公布日期 2007.11.29
申请号 SG20060026439 申请日期 2006.04.19
申请人 UNITED MICROELECTRONICS CORP. 发明人 CHING-WEN TENG;KUN LIN CHIN-;YU-HSIANG TSENG;TIONG NEO BOON-
分类号 (IPC1-7):H01L21/461 主分类号 (IPC1-7):H01L21/461
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