发明名称 HALBTONPHASENSCHIEBERMASKE, ROHLING DAVON SOWIE VERFAHREN ZUR ERZEUGUNG EINES MUSTERS
摘要 The invention is relates to a halftone phase shift photomask whose transmittance and phase angle remain unchanged even when irradiated with an excimer laser used for exposure over an extended period of time, and a blank therefor, and provides a halftone phase shift mask 108 comprising a pattern of halftone phase shift film 102 containing at least chromium and fluorine on a transparent substrate 101, wherein optical characteristic changes upon irradiation with an exposure excimer laser have been reduced by patterning a film irradiated with light 109 having a wavelength substantially absorbed by halftone phase shift film 102. <IMAGE>
申请公布号 DE60036779(D1) 申请公布日期 2007.11.29
申请号 DE2000636779 申请日期 2000.08.16
申请人 DAI NIPPON PRINTING CO. LTD. 发明人 MOHRI, HIROSHI;MOTONAGA, TOSHIAKI;HATSUTA, CHIAKI;ITO, NORIHITO;HAYASHI, NAOYA;ONODERA,TOSHIO;MATSUO,TAKAHIRO;OGAWA, TORU;NAKAZAWA, KEISUKE
分类号 H01L21/027;G03F1/32;G03F1/68 主分类号 H01L21/027
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