发明名称 METHOD OF DETECTING FOREIGN MATTER STUCK WHEN COATING FILM IS FORMED USING SLIT NOZZLE AND METHOD OF MONITORING PLATE THICKNESS OF GLASS SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a method of detecting foreign matter stuck in the formation of a coating film, wherein the crack of the glass substrate or the damage of the tip of a slit nozzle due to the interference between the surface of the glass substrate and the tip of the slit nozzle which is caused by the foreign matters stuck on the surface of a stage or the rear surface of the glass substrate is prevented in the formation of the coating film on the glass substrate using the slit coater. SOLUTION: A glass substrate surface detecting sensor 51 and a stage face detecting sensor 61 are provided in the slit nozzle 31. The clearance L1 between the tip of the slit nozzle 31 and the surface of the glass substrate 21 is measured by the glass substrate surface detecting sensor 51 and the clearance L2 between the tip of the slit nozzle 31 and the stage 11 is measured by the stage face detecting sensor 61. The foreign matters stuck on the stage surface and the rear face of the glass substrate are identified by comparing the difference (L2-L1) of the clearance of L1 and L2 with the thickness of the charged glass substrate. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007301495(A) 申请公布日期 2007.11.22
申请号 JP20060133588 申请日期 2006.05.12
申请人 TOPPAN PRINTING CO LTD 发明人 MATSUSHIMA TAKAYUKI
分类号 B05D3/00;B05D1/26 主分类号 B05D3/00
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