发明名称 SEMICONDUCTOR DEVICE, MANUFACTURING METHOD THEREOF, ELECTRONIC EQUIPMENT AND MANUFACTURING METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To increase capacitor capacitance while reducing parasitic capacitance between multilayered wires (vertically located wires) in a semiconductor device having a capacitor. SOLUTION: A photoresist film 3 is formed on a glass substrate 1. The photoresist film is selectively removed to form grooves including a groove 3c with a depth T1 and a groove 3d with a shallower depth T2 (<T1). A conductive material liquid is poured into the grooves, and heat treatment is performed to form a conductive film (lower layer wire) and a conductive film (lower electrode). An insulation film is formed on them. A conductive film (upper layer wire) and a conductive film (upper electrode) are formed on the insulation film. As a result, a distance can be increased between the lower layer wire and the upper layer wire, thereby reducing parasitic capacitance between them. In addition, a distance between the lower electrode and the upper electrode can be decreased, thereby increasing capacitance between them. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007305796(A) 申请公布日期 2007.11.22
申请号 JP20060132953 申请日期 2006.05.11
申请人 SEIKO EPSON CORP 发明人 KAMAKURA TOMOYUKI
分类号 H01L21/768;G02F1/1343;G02F1/1368;G09F9/30;H01L21/288;H01L21/3205;H01L21/336;H01L23/522;H01L29/786;H01L51/50 主分类号 H01L21/768
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