发明名称 Semiconductor device with a distributed plating pattern
摘要 A substrate, and a semiconductor die package formed therefrom, are disclosed which include a distributed plating pattern for reducing mechanical stress on the semiconductor die. The substrate according to embodiments of the invention may include traces and contact pads plated in a double image plating process. Additionally, the substrate may include dummy plating areas including plating material. The plated vias and/or traces and the plating material within the dummy plating areas provide a plating pattern which is evenly distributed across the surface of the substrate. The even distribution of the plating pattern prevents peaks and valleys in the finished substrate.
申请公布号 US2007267759(A1) 申请公布日期 2007.11.22
申请号 US20060435518 申请日期 2006.05.17
申请人 LIAO CHIH-CHIN;CHEN HAN-SHIAO;CHIU CHIN-TIEN;YU CHEEMEN;TAKIAR HEM 发明人 LIAO CHIH-CHIN;CHEN HAN-SHIAO;CHIU CHIN-TIEN;YU CHEEMEN;TAKIAR HEM
分类号 H01L23/48 主分类号 H01L23/48
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