发明名称 Semiconductor structure, has low trench passing into semiconductor substrate and electrically insulating buried layer, and low impedance contact formed in low trench of insulation trench for contacting buried layer
摘要 <p>The structure has a highly doped buried layer (2) formed in parts of a semiconductor substrate (1). A single-crystal semiconductor layer (3) is arranged on the semiconductor substrate and the buried layer. A low trench (5) is filled with an insulating material for forming an insulation trench for electric insulation of regions of the structure. The low trench passes into the substrate and electrically insulates the buried layer. A low impedance contact (21) is formed in the low trench of the insulation trench for contacting the buried layer. An independent claim is also included for a method for manufacturing a semiconductor structure.</p>
申请公布号 DE102006023731(A1) 申请公布日期 2007.11.22
申请号 DE20061023731 申请日期 2006.05.19
申请人 INFINEON TECHNOLOGIES AG 发明人 HARTNER, WALTER;BONART, DIETRICH;MEISER, ANDREAS;GROSS, THOMAS
分类号 H01L29/78;H01L21/336;H01L21/74 主分类号 H01L29/78
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