| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device that has a mechanism for locating a physical failure in a data bus and also a logical failure in data transfer, and a data transfer failure analysis method therefor. <P>SOLUTION: Test circuits of semiconductor integrated circuits exchange test data via a path including the data bus 12, and the test circuit of the semiconductor integrated circuit that has received the test data determines a data transfer failure according to the comparison of the received test data with reference data. <P>COPYRIGHT: (C)2008,JPO&INPIT |
