发明名称 MANUFACTURING METHOD OF SILICON CARBIDE SUBSTRATE FOR INSULATING LAYER EMBEDDED TYPE SEMICONDUCTOR
摘要 [Purpose] A single crystal silicon carbide thin film is inexpensively and easily formed on an SOI substrate. [Constitution] The manufacturing method comprises the steps of: (1) placing in a furnace 200 an SOI substrate 100 having a surface silicon layer 130 of thickness no greater than 10nm and having a buried insulator layer 120, and increasing the temperature of the atmosphere within furnace 200 while supplying a mixture of hydrogen gas G1 and hydrocarbon gas G2 into furnace 200 so that surface silicon layer 130 is metamorphosed into single crystal silicon carbide thin film 140; (2) depositing a carbon thin film 150 on thin film 140 by excessively carrying out the first step; (3) replacing mixed gas (G1+G2) with an inert gas G4 containing oxygen gas G3 mixed in a predetermined ratio and heating SOI substrate 100 to no less than 550°C to remove carbon thin film 150 through etching; (4) replacing inert gas G4 containing oxygen gas G3 with a pure inert gas G4 and increasing the temperature of the atmosphere within furnace 200 to a predetermined temperature; and (5) supplying hydrogen gas G1 and a silane-based gas G5 into furnace 200 and maintaining the predetermined temperature of the atmosphere so that a new single crystal silicon carbide thin film 160 grows on the surface of said SOI substrate 100.
申请公布号 KR100777544(B1) 申请公布日期 2007.11.20
申请号 KR20030002943 申请日期 2003.01.16
申请人 发明人
分类号 H01L21/20;H01L21/02;H01L21/04;H01L21/205;H01L21/76;H01L21/762;H01L27/12 主分类号 H01L21/20
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