发明名称 Charge-trapping memory cell and method for production
摘要 The memory cell array comprises a plurality of parallel fins provided as bitlines arranged at a distance of down to about 40 nm from one another and having a lateral dimension of less than about 30 nm, subdivided into pairs of adjacent first and second fins. A charge-trapping memory layer sequence is arranged on the fins. Wordlines are arranged across the fins, and source/drain regions are located in the fins between the wordlines and at the ends of the fins. There are preferably self-aligned contact areas of the source/drain regions at the ends of the fins, each contact area being common to the fins of one of said pairs. Select transistors and select lines are provided for the first and second fins individually to enable a separate addressing of the memory cells.
申请公布号 US7298004(B2) 申请公布日期 2007.11.20
申请号 US20040000350 申请日期 2004.11.30
申请人 INFINEON TECHNOLOGIES AG 发明人 SPECHT MICHAEL;ROESNER WOLFGANG;HOFMANN FRANZ
分类号 H01L29/788 主分类号 H01L29/788
代理机构 代理人
主权项
地址