发明名称 System and method to improve chip yield, reliability and performance
摘要 Improving semiconductor chip yield and reliability by connecting adjacent metal traces that are on a same network with metal shorts. This reduces and/or eliminates the need for redundant vias formerly employed in semiconductor chip design. Additionally, the metal shorts are placed in conformance with one or more pre-determined design rules. Once placed, the metal shorts are checked to ensure that each metal short connects groundrule clean, thereby ensuring the placement is correct-by-construction.
申请公布号 US7299426(B2) 申请公布日期 2007.11.20
申请号 US20050908803 申请日期 2005.05.26
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BONGES, III HENRY A.
分类号 G06F17/50 主分类号 G06F17/50
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