发明名称 |
APPARATUS AND METHOD FOR TREATING SUBSTRATE |
摘要 |
A substrate treating apparatus and a method for treating a substrate are provided to minimize generation of process errors from a part of a wafer and to suppress excessive rotation of a supporting member. A plate(10) has a rotatable structure and supports a substrate. A processing liquid supply unit(50) supplies a processing liquid onto the substrate loaded on the plate. A plurality of supporting members(20) are installed on an upper surface of the plate. The supporting members come in contact with a lateral part of the substrate in order to prevent ejection of the substrate from the plate. A plurality of driven shafts(30) are connected to lower parts of the supporting members. A driving member(40) is formed to rotate the driven shafts. A control unit(60) controls the driving member in order to rotate the supporting members while the processing liquid is supplied onto the substrate.
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申请公布号 |
KR100777658(B1) |
申请公布日期 |
2007.11.19 |
申请号 |
KR20060052664 |
申请日期 |
2006.06.12 |
申请人 |
SEMES CO., LTD. |
发明人 |
CHOI, SEUNG JU;YOON, CHANG RO |
分类号 |
H01L21/02 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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