发明名称 APPARATUS AND METHOD FOR TREATING SUBSTRATE
摘要 A substrate treating apparatus and a method for treating a substrate are provided to minimize generation of process errors from a part of a wafer and to suppress excessive rotation of a supporting member. A plate(10) has a rotatable structure and supports a substrate. A processing liquid supply unit(50) supplies a processing liquid onto the substrate loaded on the plate. A plurality of supporting members(20) are installed on an upper surface of the plate. The supporting members come in contact with a lateral part of the substrate in order to prevent ejection of the substrate from the plate. A plurality of driven shafts(30) are connected to lower parts of the supporting members. A driving member(40) is formed to rotate the driven shafts. A control unit(60) controls the driving member in order to rotate the supporting members while the processing liquid is supplied onto the substrate.
申请公布号 KR100777658(B1) 申请公布日期 2007.11.19
申请号 KR20060052664 申请日期 2006.06.12
申请人 SEMES CO., LTD. 发明人 CHOI, SEUNG JU;YOON, CHANG RO
分类号 H01L21/02 主分类号 H01L21/02
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