发明名称 SCHUTZ GEGEN ELEKTROSTATISCHE ENTLADUNG FÜR INTEGRIERTE SCHALTUNGEN
摘要 Electrical connection pads for integrated semiconductor circuits have a protective diode formed by a doped region located in a well of opposite doping and another protective diode formed by a well which surrounds another doped region of the same doping type as a contact area and is surrounded by another well of oppositive doping. The doped regions are connected to the pad and are continuous. Narrow strips extend at or along a portion of the periphery of the pad. Also, the well for which the other doped region serves as a contact, has a strip-shape and is located at the periphery of the pad. The other doped region is also used as a contact for forming an electrical resistor connected to an input/output path of the integrated circuit. The resistor is formed in the well surrounding the other doped region. Another contact of the resistor is formed by a further doped region of the same doping type, also having a strip-shape and located in the same well at the periphery of the pad and beneath a marginal portion of the pad. The resistor thereby does not require any extra space.
申请公布号 AT377844(T) 申请公布日期 2007.11.15
申请号 AT20000906848T 申请日期 2000.02.09
申请人 INFINEON TECHNOLOGIES AG 发明人 PETTERSSON, OLA
分类号 H01L21/66;H01L23/60;H01L21/82;H01L21/822;H01L21/8234;H01L21/8238;H01L27/02;H01L27/04;H01L27/06;H01L27/088;H01L27/092;H01L29/861 主分类号 H01L21/66
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