发明名称 SIMULTANEOUS INORGANIC, ORGANIC AND BYPRODUCT ANALYSIS IN ELECTROCHEMICAL DEPOSITION SOLUTIONS
摘要 Real-time analysis of electrochemical deposition (ECD) metal plating solutions is described, for the purpose of reducing plating defects and achieving high quality metal deposition. Improved plating protocols are utilized for increasing potential signal strength and reducing the time required for each measurement cycle. New methods and algorithms for simultaneously determining concentrations of organic additives, inorganic additives, and/or byproducts in a sample ECD solution are described. In one aspect, a method is provided for simultaneously determining concentrations of all organic additives, inorganic additives, and/or byproducts within a single experimental run by using a single analytical cell, while interactions between such additives are properly accounted for.
申请公布号 US2007261963(A1) 申请公布日期 2007.11.15
申请号 US20070670507 申请日期 2007.02.02
申请人 ADVANCED TECHNOLOGY MATERIALS, INC. 发明人 HAN JIANWEN;KING MACKENZIE;TOM GLENN M.;LURCOTT STEVEN M.
分类号 C25D21/00 主分类号 C25D21/00
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