TEST CIRCUIT AND TEST METHOD

摘要

PROBLEM TO BE SOLVED: To provide a test circuit which performs a test of an amplifier part and a test of a leak current between light receiving elements, of which the chip size is small. SOLUTION: The test circuit is provided with a plurality of light receiving elements 101 to 104, amplifier parts 111 to 114 converting respectively light current from the light receiving elements 101 to 104 to voltage, and current supply parts 121 and 122 supplying a current to the light receiving elements 101 to 104 and the amplifier parts 111 to 114, wherein the current supply parts 121 and 122 supply a current selectively to a plurality of light receiving elements 101 and 103 which are not adjacent each other in the row and column direction out of the plurality of light receiving elements 101 to 104 and a plurality of light receiving elements 102 and 104 being adjacent in the row and column direction to the light receiving element 101 and 103. COPYRIGHT: (C)2008,JPO&INPIT