发明名称 NONVOLATILE SEMICONDUCTOR MEMORY
摘要 PROBLEM TO BE SOLVED: To raise a coupling ratio without varying a threshold by an inter-cell interference effect. SOLUTION: A nonvolatile semiconductor memory includes first and second memory cells with a stack gate structure having floating gates FG1, FG2, and a control gate CG. The floating gates FG1, FG2 of the first and second memory cells are respectively constituted of a first part FG1 and a second part FG2 which is arranged on the first part FG1 and whose width in the extending direction of the control gate CG is smaller than that of the first part FG1. A first space between the first parts FG1 of the first and second memory cells is filled with one kind of insulating body. The control gate CG is arranged in a second space between the second parts of the first and second memory cells via a dielectric body having permittivity higher than that of the one kind of insulating body. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007294595(A) 申请公布日期 2007.11.08
申请号 JP20060119416 申请日期 2006.04.24
申请人 TOSHIBA CORP 发明人 ICHIGE MASAYUKI;ARAI FUMITAKA;SHIRATA RIICHIRO;YAEGASHI TOSHITAKE;OZAWA YOSHIO;YAMAMOTO AKITO;MIZUSHIMA ICHIRO;SAITO YOSHIHIKO
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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