发明名称 METHOD OF EVALUATING SUBSTRATE FOR LIQUID CRYSTAL, AND METHOD OF MANUFACTURING THE LIQUID CRYSTAL
摘要 PROBLEM TO BE SOLVED: To provide a method of evaluating a substrate for a liquid crystal in which a light resistance lifetime of the liquid crystal device can be evaluated, in a short time, and to provide a method of manufacturing the liquid crystal. SOLUTION: The method of manufacturing the liquid crystal includes a step of forming inorganic alignment films 16 and 22 on substrates 10' and 20' to form substrates 10 and 20 for the liquid crystal device, and a light resistance evaluating step of estimating amounts of water adsorption of the inorganic alignment films 16 and 22 and comparing the amounts of water adsorption with a prescribed value, to evaluate the light resistance life of the liquid crystal device 1, comprising the substrates 10 and 20, for the liquid crystal. Through this light resistance evaluating step, the pair of substrates 10 and 20 for the liquid crystal which constitute the liquid crystal 1, having a desired light resistance lifetime, are selected, and the pair of substrates 10 and 20 for the liquid crystal are stuck together. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007293186(A) 申请公布日期 2007.11.08
申请号 JP20060123404 申请日期 2006.04.27
申请人 SEIKO EPSON CORP 发明人 SUZUKI SATOSHI
分类号 G02F1/13 主分类号 G02F1/13
代理机构 代理人
主权项
地址