发明名称 REPAIR CIRCUIT OF SEMICONDUCTOR MEMORY DEVICE
摘要 A repair circuit of a semiconductor memory device is provided to reduce the area of a semiconductor chip by reducing an address line, by sharing a decoded address outputted from an address decoder in a fuse box. An address input circuit(110) outputs an address. A row address decoder(120) decodes an address. A sub word line driver(150) repairs a defective main word line among a number of main word lines connected to a main word line driver(140) according to the output of the row address decoder. A fuse box(130) generates a repair control signal to prevent the output of the row address decoder provided to the defective main word line according to the output of the row address decoder.
申请公布号 KR20070107886(A) 申请公布日期 2007.11.08
申请号 KR20060040428 申请日期 2006.05.04
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, JEONG WOO
分类号 G11C29/04 主分类号 G11C29/04
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