发明名称 Homoepitaxial gallium nitride based photodetector and method of producing
摘要 A photodetector ( 100, 200, 300 ) comprising a gallium nitride substrate, at least one active layer ( 104, 302 ) disposed on the substrate ( 102, 202, 306 ), and a conductive contact structure ( 106, 210, 308 ) affixed to the active layer ( 104, 302 ) and, in some embodiments, the substrate ( 102, 202, 306 ). The invention includes photodetectors ( 100, 200, 300 ) having metal-semiconductor-metal structures, P-i-N structures, and Schottky-barrier structures. The active layers ( 104, 302 ) may comprise Ga<SUB>1-x-y</SUB>Al<SUB>x</SUB>In<SUB>y</SUB>N<SUB>1-z-w </SUB>P<SUB>z</SUB>As<SUB>w</SUB>, or, preferably, Ga<SUB>1-x</SUB>Al<SUB>x</SUB>N. The gallium nitride substrate comprises a single crystal gallium nitride wafer and has a dislocation density of less than about 10<SUP>5 </SUP>cm<SUP>-2</SUP>. A method of making the photodetector ( 100, 200, 300 ) is also disclosed.
申请公布号 US7291544(B2) 申请公布日期 2007.11.06
申请号 US20040932127 申请日期 2004.09.01
申请人 GENERAL ELECTRIC COMPANY 发明人 D'EVELYN MARK PHILIP;EVERS NICOLE ANDREA;CHU KANIN
分类号 H01L21/20;H01L31/0224;H01L31/0304;H01L31/108 主分类号 H01L21/20
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