发明名称 SYSTEMS AND METHODS FOR DETERMINING THE VELOCITY OF ULTRASONIC SURFACE SKIMMING LONGITUDINAL WAVES ON VARIOUS MATERIALS
摘要 A system and a method for determining the velocity of ultrasonic surface skimming longitudinal waves on various materials are provided to use a method of nondestructively measuring the velocity of the ultrasonic surface skimming longitudinal waves. A system for determining the velocity of ultrasonic surface skimming longitudinal waves on various materials includes an ultrasonic emitter(10), an ultrasonic detector, and a unit for determining the velocity of the ultrasonic surface skimming longitudinal waves. The system includes a unit for determining at least one crystallization direction of the material by using the velocity of the ultrasonic surface skimming longitudinal waves. The ultrasonic emitter can emit ultrasonic waves at a predetermined angle with respect to a surface of the material.
申请公布号 KR20070106171(A) 申请公布日期 2007.11.01
申请号 KR20060038735 申请日期 2006.04.28
申请人 UNITED TECHNOLOGIES CORP.;R. BRUCE, THOMPSON 发明人 UMBACH JEFFREY A.;SMITH KEVIN D.;R. BRUCE THOMPSON
分类号 G01N29/04;G01N29/36;G01N29/38 主分类号 G01N29/04
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