发明名称 |
LITHOGRAPHY SIMULATION METHOD, PROGRAM AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a simulation method for performing high accuracy lithography simulation by an easy method. <P>SOLUTION: The method includes: a step S2 of obtaining a mask transmission function from a mask layout; a step S3 of obtaining an optical image of the mask layout by using the mask transmission function; a step S4 of applying a predetermined function filter to the mask transmission function to obtain a filtered function; and a step S5 of correcting the optical image by using the filtered function. <P>COPYRIGHT: (C)2008,JPO&INPIT |
申请公布号 |
JP2007286362(A) |
申请公布日期 |
2007.11.01 |
申请号 |
JP20060113692 |
申请日期 |
2006.04.17 |
申请人 |
TOSHIBA CORP |
发明人 |
SATAKE MASAKI;TANAKA SATOSHI |
分类号 |
G03F1/36;G03F1/68;H01L21/027 |
主分类号 |
G03F1/36 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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