发明名称 IMAGE QUALITY ANALYSIS WITH TEST PATTERN
摘要 <p>A system for the automated analysis of image quality obtained by a camera in a camera tunnel system includes a test pattern on an item for placement in the camera tunnel system and an imaging subsystem configured to capture an image of the item using the camera tunnel system, wherein the image includes an image of the test pattern. The system further includes an image analysis tool configured to automatically identify and analyze the image of the test pattern for generating one or more image quality metrics.</p>
申请公布号 WO2007124020(A2) 申请公布日期 2007.11.01
申请号 WO2007US09608 申请日期 2007.04.20
申请人 SICK, INC.;DWINELL, JOHN;BIAN, LONG, XIANG 发明人 DWINELL, JOHN;BIAN, LONG, XIANG
分类号 H04N9/093 主分类号 H04N9/093
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