发明名称 A PROCESS OF IMAGING A PHOTORESIST WITH MULTIPLE ANTIREFLECTIVE COATINGS
摘要 <p>A process for imaging a photoresist comprising the steps of, a) forming a stack of multiple layers of organic antireflective coatings on a substrate; b) forming a coating of a photoresist over the upper layer of the stack of multiple layers of organic antireflective coatings; c) imagewise exposing the photoresist with an exposure equipment; and, d) developing the coating with a developer.</p>
申请公布号 EP1849039(A2) 申请公布日期 2007.10.31
申请号 EP20060710463 申请日期 2006.02.09
申请人 AZ ELECTRONIC MATERIALS USA CORP. 发明人 ABDALLAH, DAVID, J.;NEISSER, MARK, O.;DAMMEL, RALPH, R.;PAWLOWSKI, GEORG;BIAFORE, JOHN;ROMANO, ANDREW, R.;KIM, WOOKYU
分类号 G03F7/09 主分类号 G03F7/09
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