发明名称 Semiconductor components and systems having encapsulated through wire interconnects (TWI) and wafer level methods of fabrication
摘要 A semiconductor component includes a semiconductor substrate having a substrate contact, and a through wire interconnect (TWI) attached to the substrate contact. The through wire interconnect provides a multi level interconnect having contacts on opposing first and second sides of the semiconductor substrate. The through wire interconnect (TWI) includes a via through the substrate contact and the substrate, a wire in the via having a bonded connection with the substrate contact, a first contact on the wire proximate to the first side, and a second contact on the wire proximate to the second side. The through wire interconnect (TWI) also includes a polymer layer which partially encapsulates the through wire interconnect (TWI) while leaving the first contact exposed. The semiconductor component can be used to fabricate stacked-systems, module systems and test systems. A method for fabricating the semiconductor component can include a film assisted molding process for forming the polymer layer.
申请公布号 US2007246819(A1) 申请公布日期 2007.10.25
申请号 US20060409638 申请日期 2006.04.24
申请人 MICRON TECHNOLOGY, INC. 发明人 HEMBREE DAVID R.;WOOD ALAN G.
分类号 H01L23/04 主分类号 H01L23/04
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