Semiconductor exercising apparatus, test socket apparatus and method of making thereof

摘要

Products and assemblies are provided for socketably receiving elongate interconnection elements (516), such as spring contact elements, extending from electronic components (518), such as semiconductor devices. Socket substrates (504) are provided with capture pads (506) for receiving ends of elongate interconnection elements (516) extending from electronic components (518). Various capture pad configurations are disclosed. A securing device such as a housing (520) positions the electronic component securely to the socket substrate (504). Connections to external devices are provided via conductive traces (510) adjacent the surface of the socket substrate. The socket substrate (504) may be supported by a support substrate (502). In a particularly preferred embodiment the capture pads are formed directly on a primary substrate such as a printed circuit board.