发明名称 CMOS device with improved performance and method of fabricating the same
摘要 A complementary metal oxide semiconductor (CMOS) device having improved performance includes a first device active region including at least one pair of transistor active regions wherein one transistor active region has a first width and the other transistor active region for forming a contact has a second width, a first gate arranged on the first device active region, a MOS transistor of a first conductivity type including a source/drain region of the first conductivity type formed in the first device active region, a second device active region having a third width greater than the first width, a second gate arranged on the second device active region, and a MOS transistor of a second conductivity type including a source/drain region of the second conductivity type formed in the second device active region.
申请公布号 US7285831(B2) 申请公布日期 2007.10.23
申请号 US20050179434 申请日期 2005.07.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JUNG MU-KYENG;KANG HEE-SUNG;RYU HYUK-JU;CHUNG WOO-YOUNG;KIM KYUNG-SOO
分类号 H01L29/94;H01L29/78 主分类号 H01L29/94
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